HP-DQ Series (Embedded) Dynamic Signal Measurement & Analysis System

SKU HP-DQ Category

HP-DQ is an embedded dynamic signal DAQ and analysis system featuring 8–64 synchronized channels, 0.1 Hz–256 kHz sampling, 24-bit ADC, and a built-in Windows 10 touchscreen host for standalone acquisition, analysis, and permanent data storage.

Additional information

Embedded platform with USB 2.0

USB2.0 data transmission, acquisition module control, and CNC-machined enclosure for reliable field/lab use.

Built-in analysis workflow

Parameter setup, data processing, data export, data statistics, and stress calculation.

Battery management for off-grid testing

Lithium battery charge/discharge management supports long-duration off-grid operation (designed for 6+ hours; built-in battery ensures continuous operation for ≥4 hours).

Standalone Win10 host

Built-in Windows 10 test host—no external PC required for testing, analysis, and processing.

Local permanent storage

Built-in SSD storage (32G + 64G option) supports long-term data retention.

Product Details

Product Overview

HP-DQ integrates acquisition module control, on-device analysis, and data management in a rugged embedded platform. With USB 2.0 data transfer, configurable parameters, data processing/export/statistics, and stress calculation tools, it is designed for multi-sensor test scenarios without relying on an external PC.


Typical Applications

  • Multi-sensor synchronized tests: strain + voltage/current + displacement + temperature + vibration

  • Field testing where a PC is inconvenient (embedded Win10 + touchscreen)

  • Projects requiring on-device processing, statistics, and export-ready datasets

  • Environments needing stable acquisition with mixed sensor inputs


Signal & Sensor Support

  • Strain bridges: Full bridge, half bridge, quarter bridge (2-wire / 3-wire), quarter-bridge compensation

  • Voltage: ±5 mV to ±10 V

  • Current: ±20 mA, 0–20 mA, 4–20 mA

  • Temperature (thermocouples): 0–1500°C

  • Pressure: strain-type pressure sensors, load cells

  • Displacement: strain-type, resistive, inductive, LVDT, eddy current, laser displacement

  • Acceleration / Velocity: magnetic, resistive, capacitive, IEPE, ICP types

  • Strain-type transducers: force, pressure, torque, displacement sensors

  • Other sensors (V/I output): pore water pressure gauges, earth pressure gauges, and similar sensors with voltage/current outputs

Parameter Specification
Channels / measurement points 8–64 channels, all-channel synchronous acquisition
Sampling rate 0.1 Hz–256 kHz, 1 Hz step, software configurable
Measurement type Each channel can select input type; mixed sensor access; no external conditioning module required
Strain Full bridge / half bridge / quarter bridge (2-wire / 3-wire), quarter-bridge compensation
Voltage ±5 mV to ±10 V
Current ±20 mA, 0–20 mA, 4–20 mA
Temperature 0–1500°C (thermocouples)
Pressure Strain-type pressure sensors, load cells
Displacement Strain, resistive, inductive, LVDT, eddy current, laser displacement
Acceleration / velocity Magnetic, resistive, capacitive, IEPE, ICP types
Strain-type transducers Force, pressure, torque, displacement transducers
Other sensors Pore water pressure / earth pressure and other voltage/current output sensors
Front-end excitation (per channel) 0–10 V / 400 mA, software set; accuracy 0.1%
Rear excitation outputs +24 V, +12 V
IEPE constant current Built-in IEPE 4 mA constant current + conditioning circuit
ADC resolution 24-bit
Measurement accuracy ±0.2%
Balance Full-scale independent D/A auto-balance; completes all-channel balance in 5 seconds
Trigger modes Free / external / internal trigger; 4-pin SYNC port; isolated DC 5V 0.1A supply; level & edge recognition
Operating system Built-in Windows 10 host; 8″ capacitive touchscreen; built-in storage (32G); standalone test/analysis/processing
Power Built-in lithium battery; designed for field work (continuous operation specification per configuration)

 

FAQ

Q1: What makes HP-DQ “embedded”?
It integrates the acquisition host, analysis functions, touchscreen operation, and storage inside the device—so it can run tests without an external PC.

Q2: Can HP-DQ handle mixed sensors in one test?
Yes. Each channel can be configured for different input types, enabling mixed sensor measurement with synchronized acquisition.

Q3: Does HP-DQ support IEPE/ICP sensors?
Yes. Built-in IEPE 4 mA constant current and conditioning support common IEPE/ICP sensors.

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