HP-DE/HP-DEM is a high-speed, multi-channel dynamic signal DAQ and analysis system offering synchronous parallel sampling up to 1 MHz, universal mixed inputs (strain/voltage/current/IEPE), and stability features like online self-calibration, hardware auto-balance, and automatic fault diagnosis.
| Universal mixed inputs | Each input channel can be configured for different analog measurement types (strain, voltage, current, etc.) without additional auxiliary modules. |
|---|---|
| High-speed synchronized acquisition | All channels sample/display/save synchronously, with a maximum sampling rate up to 1 MHz and 1 Hz step software adjustment. |
| Online self-calibration | Each channel supports online auto calibration to compensate for environmental temperature/humidity changes, time drift, and temperature drift—improving long-term stability. |
| Hardware auto-balance (zero) without losing range | Hardware automatically adjusts bridge zero to keep symmetry during tests; supports TEDS and intelligent cable functions. |
| Automatic fault diagnosis | Detects front-end sensor issues such as short/open circuit, saturation/over-range, and full-scale faults, then provides troubleshooting guidance. |
Built for higher-bandwidth measurements, HP-DE/HP-DEM supports synchronized acquisition across multiple channels while maintaining long-term stability. It is suitable for dynamic tests involving vibration/acceleration (IEPE/ICP), strain, voltage/current loops, and other analog signals—especially where high sampling rate and consistent channel behavior are critical.
High-speed vibration and shock tests (IEPE/ICP accelerometers)
Dynamic strain measurements requiring higher sampling rates
Multi-channel synchronized data capture for R&D and durability testing
Test setups where long-term stability and diagnostic capability reduce downtime
Bridge / Strain: Full bridge, half bridge, quarter bridge; bridge arm resistance 120 Ω / 350 Ω per channel
Voltage (AC/DC ranges): ±5 mV, ±10 mV, ±50 mV, ±100 mV, ±500 mV, ±1 V, ±5 V, ±10 V
Current: ±40 mA, 1–20 mA, 4–20 mA (no external shunt resistor required)
Acceleration / Velocity: magnetic, resistive, capacitive, IEPE / ICP, etc.
| Parameter | Specification |
|---|---|
| Channels / measurement points | 8–40 channels per unit; multi-unit networking supports 1000+ channels |
| Sampling rate | All channels synchronous parallel sampling; 1 Hz–1 MHz software set |
| Measurement accuracy | ±0.1% (optional customized 0.05%) |
| Excitation – programmable constant voltage | 0–12 VDC / 50 mA, software programmable; 1 mV step; accuracy 0.04% ± 1 mV |
| Excitation – programmable constant current | 0.001–50 mADC, software programmable; 1 µA step; accuracy 0.05% ± 2 µA |
| Fixed excitation outputs | 24 VDC / 40 mA, ±15 VDC / 50 mA |
| IEPE constant current | Built-in 4 mA ± 10% constant current + conditioning; compliance voltage 24 V |
| Dynamic range | 108 dB @ 1 kS/s @ 10 V range |
| On-board storage | Built-in 1 TB SSD; real-time data backup; SSD data accessible via external monitor |
| Dual-storage safeguard | Optional: device + control PC dual-storage to prevent data loss during tests |
| Embedded system | Linux |
| ADC resolution | 18-bit (SAR / successive-approximation type) |
| Optional accessories | Strain signal input cable (optional); Voltage signal input cable (optional) |
Q1: When should I choose HP-DE/HP-DEM instead of 256 kHz systems?
Choose HP-DE/HP-DEM when your test requires higher bandwidth and sampling up to 1 MHz across synchronized channels.
Q2: Does it support IEPE / ICP accelerometers?
Yes. Built-in 4 mA constant current and conditioning support common IEPE/ICP sensors.
Q3: How does the system stay stable during long tests?
Online self-calibration compensates for environmental and time drift, while hardware auto-balance keeps bridge symmetry without losing measurement range.