HP-DA/HP-DAM is a high-accuracy, multi-channel dynamic signal DAQ and analysis platform with 24-bit ADC, synchronous parallel sampling up to 256 kHz, online self-calibration, TEDS support, and built-in 1TB SSD for safer data capture.
| Universal mixed inputs (true multi-signal) | Each input channel can select different analog measurement types (strain, voltage, current, etc.) without extra auxiliary modules. |
|---|---|
| High-speed synchronized acquisition | All measurement points sample/display/save synchronously; up to 256 kHz max sampling rate, with 1 Hz step adjustment. |
| Online self-calibration (long-term stability) | Each channel supports online auto calibration to compensate for environmental temperature/humidity changes, time drift, and temperature drift. |
| Hardware auto-balance (zero) + range symmetry | Automatic bridge zero balancing helps keep full-scale symmetry without losing measurement range; supports TEDS and intelligent cable functions. |
| Automatic fault diagnosis | Detects front-end sensor issues (short/open circuit, over-range/saturation, full-scale faults) and provides troubleshooting guidance. |
Designed for demanding test environments, HP-DA/HP-DAM combines flexible multi-sensor inputs (strain, voltage, current, vibration, etc.) with long-term stability features. It supports synchronized acquisition, automated balancing, intelligent wiring functions, and fault diagnosis—ideal for labs, test benches, and multi-channel measurement networks.
High-channel-count dynamic tests with synchronized sampling
Mixed sensor measurement (strain + voltage + current + vibration/IEPE + temperature)
Reliability & durability tests requiring long-term stability and online calibration
Projects needing on-device storage + backup to reduce data-loss risk
Bridge / Strain: Full bridge, half bridge, quarter bridge; bridge arm resistance 120 Ω / 350 Ω per channel
Voltage (AC/DC): ±5 mV, ±10 mV, ±50 mV, ±100 mV, ±500 mV, ±1 V, ±5 V, ±10 V
Current: ±40 mA, 1–20 mA, 4–20 mA (no external shunt resistor required)
Acceleration / Velocity: magnetic, resistive, capacitive, IEPE / ICP, etc.
| Parameter | Specification |
|---|---|
| Channels / measurement points | 8–72 channels per unit; multi-unit networking supports 1000+ channels |
| Sampling rate | All channels synchronous parallel sampling; 1 Hz–256 kHz software set |
| Measurement accuracy | ±0.1% (optional customized 0.05%) |
| Excitation – programmable constant voltage | 0–12 VDC / 50 mA, software programmable; 1 mV step; accuracy 0.04% ± 1 mV |
| Excitation – programmable constant current | 0.001–50 mADC, software programmable; 1 µA step; accuracy 0.05% ± 2 µA |
| Fixed excitation outputs | 24 VDC / 40 mA, ±15 VDC / 50 mA |
| IEPE constant current | Built-in 4 mA ± 10% constant current + conditioning; compliance voltage 24 V |
| Dynamic range | 120 dB @ 1 kS/s @ 10 V range |
| On-board storage | Built-in 1 TB SSD; real-time data backup; SSD data accessible via external monitor |
| Dual-storage safeguard | Optional: device + control PC dual-storage to prevent data loss during tests |
| Embedded system | Linux |
| ADC resolution | 24-bit |
| Optional accessories | Strain signal input cable (optional); Voltage signal input cable (optional) |
Q1: What makes HP-DA/HP-DAM “high accuracy” for long tests?
Online self-calibration per channel compensates for drift from environment and time, improving long-term stability.
Q2: Does it support TEDS and intelligent wiring?
Yes. The system supports TEDS and intelligent cable functions for more efficient setup and identification.
Q3: How do you protect data during long acquisitions?
A built-in 1 TB SSD supports real-time backup, and an optional dual-storage strategy with the control PC helps ensure data integrity.