HP-CD Series (2–20 MHz) Ultra-High-Speed Dynamic Signal DAQ & Analysis System

SKU HP-CD Category

The HP-CD Series is an ultra-high-speed dynamic signal data acquisition and analysis system designed for harsh / strong electromagnetic interference (EMI) environments. Each channel can connect different sensors at the same time to capture dynamic temperature, heat flux density, vibration/acceleration, and more. All channels support synchronous acquisition, display, and storage, with a maximum sampling rate up to 20 MHz.

Additional information

Mixed sensor input (true multi-purpose DAQ)

In strong EMI environments, each channel can connect different sensors simultaneously to complete dynamic measurements such as temperature, heat flux density, vibration/acceleration, etc.

Ultra-high-speed synchronous sampling (up to 20 MHz)

All measurement points support synchronous sampling, real-time display, and data logging. Sampling rate is software configurable.

Built-in excitation output

Provides 24 V constant-voltage excitation.

Modular & lightweight (scalable test system)

Modular design makes it easy to carry and deploy. Measurement points can be customized, and multiple units can be networked to build large-scale test systems.

Flexible power options for field tests

Supports AC 220V / 50Hz or DC 12V. Optional 12V lithium battery supports 4+ hours standalone runtime—ideal for outdoor, blast, or shock-impact testing.

Product Details

Technical Specifications

Item Specification
Input channels 8–32 channels per unit; multi-unit networking supports thousand-channel test systems
Sampling rate 1 Hz–20 MHz, software configurable; all channels synchronous parallel sampling
ADC resolution 18-bit
Measurement accuracy ±0.2% (custom 0.1% available)
Signal bandwidth 1–3 MHz
Bridge (strain gauge) Full bridge / half bridge / quarter bridge; 120 Ω & 350 Ω bridge arm resistors
Voltage input (AC/DC) ±5 mV, ±10 mV, ±50 mV, ±100 mV, ±500 mV, ±1 V, ±5 V, ±10 V
Current input ±40 mA, ±80 mA, 1–20 mA, 4–20 mA; no external shunt required; min resolution 0.1 μA
Dynamic sensors Acceleration / velocity: magnetic, resistive, capacitive, IEPE/ICP, etc.
Programmable excitation (CV) 0–12 VDC / 50 mA, software programmable; 1 mV step; accuracy 0.04% ± 1 mV
Programmable excitation (CC) 0.001–50 mADC, software programmable; 1 μA step; accuracy 0.05% ± 2 μA
Fixed excitation 24 VDC / 40 mA, ±15 VDC / 50 mA
IEPE constant current Built-in 4 mA (±10%) IEPE current source + conditioning; 24 V compliance
Communication interfaces USB 3.0 and Gigabit Ethernet
Data storage Built-in 1 TB SSD, real-time cache storage; SSD data accessible via external monitor; optional dual-protection storage with control PC
Power (battery) Each module built-in 8.4V 3.5Ah (4+ hrs off-grid); optional baseboard 8.4V 30Ah (up to 12+ hrs)
Embedded OS Linux
Trigger functions Software trigger / internal trigger / external trigger / ± delay; fast recognition for level, rising edge, falling edge sync triggers

Typical Applications

  • Blast / shock / impact testing (field deployment + battery runtime)

  • Vibration & acceleration testing (IEPE/ICP sensors)

  • Heat flux & temperature transient measurement

  • High-speed dynamic signal capture in strong EMI environments

  • Multi-channel structural testing and large-scale monitoring via networking

FAQ

Q1: What is a high speed data acquisition system and what is HP-CD used for?

A high speed data acquisition system (high speed DAQ) is used to capture fast transient signals that standard data loggers may miss. The HP-CD Series is built for dynamic signal testing in harsh environments, including shock/impact, vibration/acceleration, and transient temperature/heat-flux measurements, with high-speed synchronous sampling up to 20 MHz.

Q2: What is the maximum sampling rate of this 20 MHz DAQ?

HP-CD supports 1 Hz to 20 MHz sampling rate (software configurable). All channels can run synchronous parallel sampling, enabling accurate time alignment for impact and transient tests.

Q3: Is HP-CD a good data logger for high-speed transient events?

Yes. For dynamic testing, HP-CD works as a high speed data logger with synchronized sampling, real-time display, and local storage options—ideal for capturing short-duration events like shock, blast, and rapid vibration changes.

Q4: Can this DAQ system work in strong EMI / electromagnetic interference environments?

Yes. HP-CD is designed for strong EMI environments where cable noise and interference can degrade measurement quality. It is commonly deployed in demanding field tests requiring stable acquisition under heavy electromagnetic disturbance.

Q5: How many channels does the HP-CD data acquisition system support?

One HP-CD unit supports 8–32 channels. Multiple units can be networked to build a large channel-count system (including thousand-channel deployments) based on project architecture.

Q6: What sensors can I connect to this dynamic signal data acquisition system?

HP-CD supports mixed sensor inputs, including:

  • Strain gauge bridges (full/half/quarter; 120Ω & 350Ω)

  • Voltage (AC/DC) signals

  • Current signals (0–20 mA / 4–20 mA and other ranges)

  • IEPE/ICP dynamic sensors (accelerometers) and other vibration/response sensors

Q7: Does HP-CD support IEPE DAQ or ICP DAQ for accelerometers?

Yes. HP-CD includes a built-in IEPE constant current source (4 mA ±10%) and conditioning, with 24 V compliance voltage, making it suitable for IEPE/ICP accelerometer vibration and impact testing.

Q8: What excitation outputs are included for sensors (constant voltage / constant current)?

HP-CD supports multiple excitation options:

  • Programmable constant voltage: 0–12 VDC / 50 mA (1 mV step; accuracy 0.04% ±1 mV)

  • Programmable constant current: 0.001–50 mA (1 μA step; accuracy 0.05% ±2 μA)

  • Fixed excitation: 24 VDC / 40 mA, ±15 VDC / 50 mA
    This covers common sensor powering needs for dynamic testing.

Q9: What trigger modes does this high speed DAQ support for shock/impact capture?

HP-CD supports software trigger, internal trigger, and external trigger, with sync recognition including level, rising edge, and falling edge. This helps ensure reliable capture of sudden events such as shock and blast tests.

Q10: What is the signal bandwidth of HP-CD?

HP-CD supports 1–3 MHz signal bandwidth (depending on configuration), which is critical for measuring high-frequency dynamic content in transient and vibration signals.

Q11: How is data stored in the HP-CD data logger? Can it work without a PC?

HP-CD can be configured with built-in local SSD storage (e.g., 1 TB) for real-time caching and logging. Data can be accessed through supported display/monitor methods, and optional dual-protection storage with a control PC is available for high-value tests.

Q12: What interfaces are available—does it support USB 3.0 DAQ or Ethernet DAQ?

Yes. HP-CD provides USB 3.0 and Gigabit Ethernet, supporting high-speed data transfer and multi-unit networking.

Q13: Can this portable high speed data acquisition system run in the field on battery power?

Yes. HP-CD supports AC 220V / 50Hz or DC 12V. Battery options include:

  • built-in 8.4V 3.5Ah per module (typically 4+ hours off-grid)

  • optional 8.4V 30Ah base battery (typically 12+ hours off-grid)

Q14: What measurement accuracy does HP-CD provide?

Standard accuracy is ±0.2%, and custom ±0.1% configurations are available depending on project requirements and measurement setup.

Q15: Do I need external shunt resistors for 4–20 mA DAQ measurements?

No. HP-CD supports multiple current ranges (including 0–20 mA and 4–20 mA) without external shunts, and provides fine resolution down to 0.1 μA.

Q16: What are common applications for a high speed data acquisition system like HP-CD?

HP-CD is often used for:

  • blast / shock / impact testing

  • vibration & acceleration measurement (IEPE/ICP)

  • high-speed transient capture in EMI environments

  • dynamic thermal tests (temperature & heat flux density)

  • multi-channel synchronized testing with scalable channel counts

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